Lecture/Seminar on Semiconductor Technology

Analysis Research & Planning for Armenia (ARPA)
18106 Miranda Street
Tarzana, CA 91356
Contact: Hagop Panossian
Tel: (818) 586-9660
E-mail: [email protected]

Armenian Engineers & Scientists of America
417 W. Arden Ave., Suite 112C
Glendale, CA 91203

ARPA Institute and AESA Present the lecture/Seminar “Today’s
Semiconductor Technology Challenges” on Friday, April 16, 2004 at 7:30
PM in the Merdinian School Auditorium. The presenter is Dr. Yervant

The address is 13330 Riverside Dr., Sherman Oaks, CA 91403.
Directios: On the 101 FY Exit on Woodman, Go North and Turn Right on
Riverside Dr.


The semiconductor technology is the backbone of the electronics
industry. Every new generation of this technology allows the creation
of chips with further miniaturization and higher performance. This
potentially increases the functions that an electronic product could
offer to the end-user. Although adding such new functions do benefit
the end-user, but they also necessitate finer and denser semiconductor
fabrication processes. This densification makes chips more susceptible
to defects. The challenges with today’s very deep-submicron
semiconductor technologies are that we are reaching defect
susceptibility levels that result in lowering the manufacturing yield
and field reliability. This lecture will present an introduction to
modern semiconductors, as well as the basic trends and the main
challenges in semiconductor technology. It will also discuss the
increasing requirements for more reliable electronics products and the
necessary optimization approaches to improve manufact! urability.


Sr. Yervant Zorian is the Vice President and Chief Scientist of Virage
Logic Corp. Previously, he was Distinguished Member of Technical Staff
at AT&T Bell Laboratories, and Chief Technology Advisor of
LogicVision, Inc. He serves on the board of directors and technical
advisory boards of several private and publicly traded companies. His
scientific activities cover the areas of embedded IP cores, SOC and
System-in-Package design & test methodologies. Zorian received an MSc
degree from the University of Southern California, and a PhD from
McGill University.

He is currently the Vice President of IEEE Computer Society and the
Editor-in-Chief Emeritus of IEEE Design & Test of Computers
Magazine. He has chaired the IEEE Test Technology Technical Council
and founded several IEEE conferences and workshops. He is the founder
and chair of the IEEE P1500 Working Group for standardization of
embedded core test. He has published three books, several book
chapters and over 300 papers. He has been granted a dozen US patents
in the domain of embedded test and repair and has received a number of
Best Paper Awards. He was recently selected among the top thirteen
influencers on semiconductor technology worldwide. He is an honorary
doctor of the National Academy of Sciences of Armenia and a Fellow of
the IEEE.

For Information Please call Dr. Hagop Panossian at (818)586-9660 or
e-mail at [email protected]